Alumna Xinmiao Zhang elevated to IEEE Fellow
Alumna Xinmiao Zhang (Ph.D. 2005) was recently elevated to IEEE Fellow (class of 2025) for her “contributions to error-correcting codes and VLSI implementations.” Zhang earned her doctoral degree in 2005 under the guidance of Distinguished McKnight University Professor and Erwin A. Kelen Chair in Electrical Engineering Keshab Parhi. Her doctoral thesis was titled “High-speed VLSI architectures for error-correcting codes and cryptosystems.”
Zhang is a tenured faculty member at The Ohio State University and is pursuing research that spans the areas of VLSI architecture design, digital storage and communications, hardware security, cryptography, and signal processing. She has developed many VLSI architectures that improve the hardware efficiency of state-of-the-art error-correcting codes, including hard and soft-decision BCH and Reed-Solomon codes, their variations, as well as binary and non-binary low and medium-density parity-check codes. Zhang's recent research focuses on VLSI architecture design for error and erasure-correcting codes that enable hyper-speed and large-scale memory/distributed storage, homomorphic encryption, post-quantum cryptography, hardware security, and machine learning.
Zhang is a recipient of several awards including College of Engineering Lumley Research Award at The Ohio State University 2022, the NSF CAREER Award 2009, Bob Owens Best Student Paper Award at the IEEE Workshop on Signal Processing Systems 2024, Best Paper Award at International SanDisk Technology Conference 2016, and the Best Paper Award at ACM Great Lakes Symposium on VLSI 2004. She was elected the Vice President-Technical Activities of the IEEE Circuits and Systems Society (CASS) for the 2022-2023 term and served on the Board of Governors of CASS for the 2019-2021 term. She is currently the Associate Editor-in-Chief for the IEEE Transactions on Circuits and Systems-I (TCAS-I). Zhang is also the author of the book VLSI Architectures for Modern Error-Correcting Codes published by CRC Press.