IPRIME Characterization Facility Demonstrations
Thursday demonstrations are for industrial attendees only; seats are limited. There is a fee for attending the demos: $225 for IPRIME members and $500 for non-members. Registrants may attend 2-4 demos contingent on the logistics of handling the various attendees' interests, time constraints, and capacity for bodies in the various labs.
- X-ray photoelectron spectroscopy (XPS, also known as ESCA)
- Ultraviolet photoelectron spectroscopy (UPS)
- Ion beam analysis (IBA): Rutherford backscattering spectrometry (RBS) and particle-induced X-ray emission (PIXE)
- X-ray diffraction (thin film)
- Confocal Raman microscopy
- Spectroscopic ellipsometry
- Ultrahigh-vacuum scanning tunneling microscopy and spectroscopy (UHV STM)
- Instrumented nanoindentation and mapping (hard materials)
- Multifrequency atomic force microscopy (AFM) with viscoelastic and fast imaging (demo by Asylum Research)
- Intermodulation atomic force microscopy (AFM) of nanostructured thin films
Category