Michael Odlyzko

Michael Odlyzko
Transmission electron microscopy (hard materials, STEM, EDS, EELS, simulation), Characterization FacilityEducation
- PhD in Materials Science, University of Minnesota Twin Cities (2015).
- B.S. in Materials Science and Engineering, University of Illinois at Urbana-Champaign (2009).
- B.S. in Engineering Physics, University of Illinois at Urbana-Champaign (2009).
Professional Background
Present: Transmission electron microscopy scientist, UMN Characterization Facility, Minneapolis, MN.
2015-2021: Database systems support engineer, Epic Systems, Madison, WI.
2009-2015: Graduate research and teaching assistant, UMN Department of Chemical Engineering and Materials Science, Minneapolis, MN.
Biography
Michael completed a Materials Science PhD under the supervision of UMN CEMS Professor Andre Mkhoyan. As a graduate student, he grew to love atomic scale electron microscopy: using TEMs in the Shepherd Labs basement by night, nerding out on simulations and analysis scripts in an Amundson Hall office by day. After an extended detour into healthcare IT work, he is happy to do what he loves and help others do the same.
Selected Publications
Ryan J Wu, Anudha Mittal, Michael L Odlyzko, and K Andre Mkhoyan. Simplifying electron beam channeling in scanning transmission electron microscopy (STEM). Microscopy and Microanalysis, 23(4):794, 2017.
Jong Seok Jeong, Michael L Odlyzko, Peng Xu, Bharat Jalan, and K Andre Mkhoyan. Probing core-electron orbitals by scanning transmission electron microscopy and measuring the delocalization of core-level excitations. Physical Review B, 93(16):165140, 2016.
Michael L Odlyzko, Jacob T Held, and K Andre Mkhoyan. Atomic bonding effects in annular dark field scanning transmission electron microscopy. II. Experiments. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 34(4):041603, 2016.
Michael L Odlyzko, Burak Himmetoglu, Matteo Cococcioni, and K Andre Mkhoyan. Atomic bonding effects in annular dark field scanning transmission electron microscopy. I. Computational predictions. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 34(4):041602, 2016.
Ryan J Wu, Michael L Odlyzko, and K Andre Mkhoyan. Determining the thickness of atomically thin MoS2 and WS2 in the TEM. Ultramicroscopy, 147:8, 2014.
Michael L Odlyzko and K Andre Mkhoyan. Identifying hexagonal boron nitride monolayers by transmission electron microscopy. Microscopy and Microanalysis, 18(3):558, 2012.
Congjun Wang, Kwan-Wook Kwon, Michael L Odlyzko, Bo Hyun Lee, and Moonsub Shim. PbSe nanocrystal/TiOx heterostructured films: A simple route to nanoscale heterointerfaces and photocatalysis. The Journal of Physical Chemistry C, 111(31):11734, 2007.