Surface properties (Mechanical, etc.)
- Atomic Force Microscopes (AFM)
- AFM Overview
- Bruker Nanoscope V Multimode 8 (SPM1) with peakforce QNM and Intermodulation AFM
- Bruker Nanoscope V Multimode 8 (SPM2) with peakforce QNM and Intermodulation AFM
- Bruker Nanoscope V Dimension ICON with peakforce QNM
- Keysight 5500 environmental (SPM3) with optional inverted light microscope
- Keysight 5500 environmental (SPM4) with optional digital pulsed force mode
- Bruker/Anasys NanoIR3
- Hysitron Triboindenter
- Microscopic Contact Angle Meter
- Picoindentor
- Tencor P10 Profilometer