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Characterization Facility
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    • Surface Properties (Ultra-High Vacuum)
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Breadcrumb

  1. Home
  2. Surface properties (Mechanical, etc.)

Surface properties (Mechanical, etc.)

  • Atomic Force Microscopes (AFM)
    • AFM Overview
    • Bruker Nanoscope V Multimode 8 (SPM1) with peakforce QNM and Intermodulation AFM
    • Bruker Nanoscope V Multimode 8 (SPM2) with peakforce QNM and Intermodulation AFM
    • Bruker Nanoscope V Dimension ICON with peakforce QNM
    • Keysight 5500 environmental (SPM3) with optional inverted light microscope
    • Keysight 5500 environmental (SPM4) with optional digital pulsed force mode
    • Bruker/Anasys NanoIR3
  • Hysitron Triboindenter
  • Microscopic Contact Angle Meter
  • Picoindentor
  • Tencor P10 Profilometer

 

Reserve an instrument here


New to CharFac? View the Work with CharFac Home

Current CharFac User? View the Current User Home


Contacts:

  • Greg Haugstad
  • Geoffrey Rojas (Shelburne)
  • Microscopic Contact Angle Meter
    • Bing Luo

Related Instruments:

  • Proximal/Local Probe Microscopes

AFM/SPM Training

Characterization Facility

100 Union Street SE, Minneapolis, MN 55455
(612) 626-7594
charfac@umn.edu

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