Proximal/Local Probe Microscopes

Description:

In scanning probe microscopy (SPM), commonly termed atomic force microscopy (AFM), the interaction of a stylus probe and sample surface is quantified and mapped across the sample.  The probe or "tip" is of nanometer-scale sharpness, and the standard image is 3D surface topography at a resolution approaching the atomic or molecular scale.  The tip is attached to a microfabricated cantilever of low spring constant.  Property-sensitive imaging modes are performed simultaneous to topographic imaging.  Gaseous or liquid media, plus sample temperature, can be controlled.  Tip chemistry can be modified for controlled studies of probe-sample interaction.

Mechanical/Rheological

• Atomic Force Microscopes (AFM)
  • Bruker Nanoscope V Multimode 8 (#1)
  • Bruker Nanoscope V Multimode 8 (#2) with optional high-speed scanning
  • Keysight 5500 environmental SPM with optional inverted light microscope
  • Keysight 5500 environmental SPM with optional high-speed force-curve mapping
  • Bruker Nanoscope V Dimension ICON
• Hysitron Triboindenter

Electrical/Magnetic

• Atomic Force Microscopes (AFM)
  • Bruker Nanoscope V Multimode 8 (#1)
  • Bruker Nanoscope V Multimode 8 (#2) with optional high-speed scanning
  • Keysight 5500 environmental SPM with optional inverted light microscope
  • Keysight 5500 environmental SPM with optional high-speed force-curve mapping​​​​​​​
  • Bruker Nanoscope V Dimension ICON
•  UHV STM/STS (cryo)

Spectral/Chemical

• Bruker/Anasys NanoIR3
•  UHV STM/STS (cryo)

Biological/Biomedical

• Atomic Force Microscopes (AFM)​​​​​​​
  • Keysight 5500 environmental SPM with optional inverted light microscope​​​​​​​
  • Keysight 5500 environmental SPM with optional high-speed force-curve mapping​​​​​​​
• Bruker/Anasys NanoIR3