Microscopy
Transmission Electron Micrscopy (TEM)
- FEI Titan Aberration-Corrected Scanning Transmission Electron Microscope
- FEI Tecnai T12 Transmission Electron Microscope
- FEI Tecnai G2 F30 Field Emission Gun
- FEI Tecnai Spirit Bio-Twin
Scanning Electron Microscopy (SEM)
- JEOL 6500 Field Emission Gun
- FEI Helios NanoLab G4 dual-beam focused ion beam
- Hitachi S-4700 Cold Field Emission Gun
- Hitachi SU8230 Field Emission Gun
Scanning Probe Microscopy (SPM)
- AFM Overview
- Bruker Nanoscope V Multimode 8 (SPM1) with peakforce QNM and Intermodulation AFM
- Bruker Nanoscope V Multimode 8 (SPM 2) with peakforce QNM and Intermodulation AFM
- Keysight 5500 environmental SPM (SPM3) with optional inverted light microscope
- Keysight 5500 environmental SPM (SPM 4) with optional digital pulsed force mode
- Bruker Nanoscope V Dimension ICON with peakforce QNM
- Bruker/Anasys NanoIR3
- Omicron Low temperature scanning tunneling microscope