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  1. Home
  2. Microscopy

Microscopy

Transmission Electron Microscopy (TEM)

  • FEI Titan Aberration-Corrected Scanning Transmission Electron Microscope
  • FEI Tecnai T12 Transmission Electron Microscope
  • FEI Tecnai G2 F30 Field Emission Gun
  • FEI Tecnai Spirit Bio-Twin
  • Thermo Fisher TALOS FX200 

Scanning Electron Microscopy (SEM)

  • JEOL 6500 Field Emission Gun
  • FEI Helios NanoLab G4 dual-beam focused ion beam
  • Hitachi SU8230 Field Emission Gun

Scanning Probe Microscopy (SPM)

  • AFM Overview
  • Bruker Nanoscope V Multimode 8 (SPM1) with peakforce QNM and Intermodulation AFM 
  • Bruker Nanoscope V Multimode 8 (SPM 2) with peakforce QNM and Intermodulation AFM 
  • Keysight 5500 environmental SPM (SPM3) with optional inverted light microscope
  • Keysight 5500 environmental SPM (SPM 4) with optional digital pulsed force mode
  • Bruker Nanoscope V Dimension ICON with peakforce QNM
  • Bruker/Anasys NanoIR3
  • Omicron Low temperature scanning tunneling microscope

Confocal Raman Microscopy

  • Confocal Raman Microscope 

Fourier Transform Infrared Spectroscopy (FTIR)

  • Fourier-Transform Infrared Spectrometer

 

Reserve an instrument here


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Current CharFac User? View the Current User Hub


Contacts:

  • Transmission Electron Microscopy (TEM)
    • Michael Odlyzko
    • Wei Zhang
    • Fang Zhou
  • Scanning Electron Microscopy (SEM)
    • Hanseung Lee
    • Nicholas Seaton
  • Scanning Probe Microscopy (SPM)
    • Greg Haugstad
    • Geoffrey Rojas
  • Raman and FTIR
    • Bing Luo 

Related Instruments:

  • Proximal/Local Probe Microscopes

Characterization Facility

100 Union Street SE, Minneapolis, MN 55455
(612) 626-7594
charfac@umn.edu

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