FEI Titan Aberration-Corrected Scanning Transmission Electron Microscope


  • Probe corrector (DCOR) for STEM spatial resolution up to 64 pm
  • High-intensity X-FEG field emission gun
  • Operation at accelerating voltages of 60, 80, 200, and 300 kV
  • HAADF, BF, and 2 DF STEM detectors
  • SuperX EDS detector for high-speed elemental mapping
  • Gatan Enfinium ER EELS spectrometer with DualEELS
  • Gun monochromator allows 0.2 eV EELS energy resolution