FEI Titan Aberration-Corrected Scanning Transmission Electron Microscope
72 Shepherd Labs
Features:
- Probe corrector (DCOR) for STEM spatial resolution up to 64 pm
- High-intensity X-FEG field emission gun
- Operation at accelerating voltages of 60, 80, 200, and 300 kV
- HAADF, BF, and 2 DF STEM detectors
- SuperX EDS detector for high-speed elemental mapping
- Gatan Enfinium ER EELS spectrometer with DualEELS
- Gun monochromator allows 0.2 eV EELS energy resolution
