FEI Tecnai T12 Transmission Electron Microscope

Description:

A transmission electron microscope (TEM) with an operating voltage range of 20 to 120 kV.  Capabilities include magnifications of thin samples (<200 nm) up to 700,000 times, an energy-dispersive X-ray spectroscopy (EDS) system, a Gatan MSC794 CCD camera for digital image acquisition, and a video camera for video-rate recording at moderate magnifications.

Equipment:

The Tecnai T12 microscope combines all imaging, diffraction, and analytical techniques at good spatial resolution and detection efficiency.  A variety of heating, cooling, and mechanical testing sample holders are available for use with this microscope.

Application-Specific Modes

• Bright- and dark-field imaging.
• TEM microprobe and nanoprobe analysis.
• Small-probe convergent beam.
• Large specimen tilt.

Accessories:

Specimen Holders -

• Single-tilt, double-tilt, and tilt–rotate holders.
• Double-tilt cooling.
• Single- and double-tilt heating.
• Straining and indenting holders.
• Low-background single-tilt EDX holder.

Energy Dispersive X-ray Spectrometer - An Oxford Inca system with an ultrathin window Si(Li) detector can detect characteristic X-rays generated by elements from beryllium to uranium.  Software allows for the analysis of signals, digital background subtraction, and automatic peak identification.

Specifications:

• The Tecnai T12 microscope combines all imaging, diffraction, and analytical techniques at good spatial resolution and detection efficiency.
• Application-specific modes include: Bright- and dark-field imaging; TEM microprobe and nanoprobe analysis; small-probe convergent beam; and large specimen tilts.
• LaB₆ source.
• Accelerating voltage range of 20 to 120 kV.
• Magnifications up to 700,000x.
• Point resolution: 0.34 nm; Line resolution: 0.2 nm.
• Maximum specimen tilt: 70�.
• Drift rate: <1 nm / min.
• Specimen holders: Single tilt; double tilt; tilt–rotate; double-tilt cooling; single- and double-tilt heating; low-background single-tilt EDX; and straining/indenting mechanical holders.
• Energy-dispersive X-ray spectrometer: Oxford Inca system with an ultrathin window allows the detection of elements from beryllium to uranium.

Sample applications include:

• Composition analysis structure of grain boundaries in ceramics.
• Magnetic films on chromium.
• Identification of precipitates in materials.
• Analysis of nanoparticle sizes.

Capabilities:

• Sample size: 3 nm discs < 1 mm thick
• Point resolution: 0.34 nm
• Line resolution: 0.2 nm
• Maximum specimen tilt: 70°
• Drift rate: <1 nm / min