FEI Tecnai T12 Transmission Electron Microscope
A transmission electron microscope (TEM) with an operating voltage range of 20 to 120 kV. Capabilities include magnifications of thin samples (<200 nm) up to 700,000 times, an energy-dispersive X-ray spectroscopy (EDS) system, a Gatan MSC794 CCD camera for digital image acquisition, and a video camera for video-rate recording at moderate magnifications.
The Tecnai T12 microscope combines all imaging, diffraction, and analytical techniques at good spatial resolution and detection efficiency. A variety of heating, cooling, and mechanical testing sample holders are available for use with this microscope.
- Bright- and dark-field imaging.
- TEM microprobe and nanoprobe analysis.
- Small-probe convergent beam.
- Large specimen tilt.
Specimen Holders -
- Single-tilt, double-tilt, and tilt–rotate holders.
- Double-tilt cooling.
- Single- and double-tilt heating.
- Straining and indenting holders.
- Low-background single-tilt EDX holder.
Energy Dispersive X-ray Spectrometer - An Oxford Inca system with an ultrathin window Si(Li) detector can detect characteristic X-rays generated by elements from beryllium to uranium. Software allows for the analysis of signals, digital background subtraction, and automatic peak identification.
- The Tecnai T12 microscope combines all imaging, diffraction, and analytical techniques at good spatial resolution and detection efficiency.
- Application-specific modes include: Bright- and dark-field imaging; TEM microprobe and nanoprobe analysis; small-probe convergent beam; and large specimen tilts.
- LaB6 source.
- Accelerating voltage range of 20 to 120 kV.
- Magnifications up to 700,000x.
- Point resolution: 0.34 nm; Line resolution: 0.2 nm.
- Maximum specimen tilt: 70ï¿½.
- Drift rate: <1 nm / min.
- Specimen holders: Single tilt; double tilt; tilt–rotate; double-tilt cooling; single- and double-tilt heating; low-background single-tilt EDX; and straining/indenting mechanical holders.
- Energy-dispersive X-ray spectrometer: Oxford Inca system with an ultrathin window allows the detection of elements from beryllium to uranium.
Sample applications include:
- Composition analysis structure of grain boundaries in ceramics.
- Magnetic films on chromium.
- Identification of precipitates in materials.
- Analysis of nanoparticle sizes.
- Sample size: 3 nm discs < 1 mm thick
- Point resolution: 0.34 nm
- Line resolution: 0.2 nm
- Maximum specimen tilt: 70°
- Drift rate: <1 nm / min