Electron Microscopes Scanning Electron Microscopes JEOL 6500 Field Emission Gun (SEM) FEI Helios NanoLab G4 dual-beam focused ion beam (SEM) Hitachi S-4700 Cold Field Emission Gun (SEM) Hitachi SU8230 Field Emission Gun (SEM) Transmission Electron Microscopes FEI Titan Aberration-Corrected Scanning Transmission Electron Microscope (STEM) FEI Tecnai T12 Transmission Electron Microscope (TEM) FEI Tecnai G2 F30 Field Emission Gun (Cryo-TEM) FEI Tecnai Spirit Bio-Twin (Cryo-TEM) Reserve an instrument here New to CharFac? View the Work with CharFac Home Current CharFac User? View the Current User Home Contacts: Scanning Electron Microscopes Hanseung Lee Nicholas Seaton Transmission Electron Microscopes Bob Hafner Jason Myers Wei Zhang Related Techniques: Microscopy Techniques Scanning Electronic Microscopy (SEM) Scanning Transmission Electron Microscopy (STEM) Cryogenic Transmission Electron Microscopy (Cryo-TEM) Transmission Electron Microscopy (TEM)
Electron Microscopes Scanning Electron Microscopes JEOL 6500 Field Emission Gun (SEM) FEI Helios NanoLab G4 dual-beam focused ion beam (SEM) Hitachi S-4700 Cold Field Emission Gun (SEM) Hitachi SU8230 Field Emission Gun (SEM) Transmission Electron Microscopes FEI Titan Aberration-Corrected Scanning Transmission Electron Microscope (STEM) FEI Tecnai T12 Transmission Electron Microscope (TEM) FEI Tecnai G2 F30 Field Emission Gun (Cryo-TEM) FEI Tecnai Spirit Bio-Twin (Cryo-TEM) Reserve an instrument here New to CharFac? View the Work with CharFac Home Current CharFac User? View the Current User Home Contacts: Scanning Electron Microscopes Hanseung Lee Nicholas Seaton Transmission Electron Microscopes Bob Hafner Jason Myers Wei Zhang Related Techniques: Microscopy Techniques Scanning Electronic Microscopy (SEM) Scanning Transmission Electron Microscopy (STEM) Cryogenic Transmission Electron Microscopy (Cryo-TEM) Transmission Electron Microscopy (TEM)