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Characterization Facility
  • About
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  • Techniques
    • Microscopy
    • X-Ray and Ion Scattering
    • Spectroscopy
    • Surface Properties (Mechanical, etc.)
    • Surface Properties (Ultra-High Vacuum)
  • Instruments
    • Electron Microscopes
    • Ion Beam Analysis
    • Light Microscopes
    • Proximal/Local Probe Microscopes
    • Sample Prep
    • Spectrometers
    • X-Ray Scattering Instruments
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Breadcrumb

  1. Home
  2. Electron Microscopes

Electron Microscopes

Scanning Electron Microscopes

  • JEOL 6500 Field Emission Gun (SEM)
  • FEI Helios NanoLab G4 dual-beam focused ion beam (SEM)
  • Hitachi S-4700 Cold Field Emission Gun (SEM)
  • Hitachi SU8230 Field Emission Gun (SEM)

Transmission Electron Microscopes

  • FEI Titan Aberration-Corrected Scanning Transmission Electron Microscope (STEM)
  • FEI Tecnai T12 Transmission Electron Microscope (TEM)
  • FEI Tecnai G2 F30 Field Emission Gun (Cryo-TEM)
  • FEI Tecnai Spirit Bio-Twin (Cryo-TEM)

Reserve an instrument here


New to CharFac? View the Work with CharFac Home

Current CharFac User? View the Current User Home


Contacts:

  • Scanning Electron Microscopes
    • Hanseung Lee
    • Nicholas Seaton
  • Transmission Electron Microscopes
    • Bob Hafner
    • Jason Myers
    • Wei Zhang

Related Techniques:

  • Microscopy Techniques
    • Scanning Electronic Microscopy (SEM)
    • Scanning Transmission Electron Microscopy (STEM)
    • Cryogenic Transmission Electron Microscopy (Cryo-TEM)
    • Transmission Electron Microscopy (TEM)

Characterization Facility

100 Union Street SE, Minneapolis, MN 55455
(612) 626-7594
charfac@umn.edu

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