JEOL JXA-8530FPlus Electron Probe Microanalyzer (EPMA)

The Electron Microprobe Laboratory offers non-destructive chemical analyses of solids through field emission JEOL JXA-8530FPlus Electron Probe Microanalyzer (EPMA) with a SXES-ER detector, installed in Spring 2018. Our electron microprobe is capable of high resolution secondary electron, backscattered electron, and cathodoluminescence imaging as well as quantitatively measuring the abundance of all elements from Be to U using four automated wavelength-dispersive spectrometers (WDS) and an energy-dispersive spectrometer (EDS) for rapid analyses. This analytical technique combines micron-scale chemical analyses with scanning electron microscopy and is capable of large- and small-scale element mapping of specimens.