FEI Helios NanoLab G4 dual-beam focused ion beam
Location: 75 Shepherd Labs
- Installed in the vibrationally isolated High Resolution Microscopy Center (HRMC).
- Provides fast, accurate, and precise milling and deposition of complex structures with critical dimensions of less than 10 nm.
- Ultimate SEM imaging resolution approaches 0.6 nm.
More detailed information is available at the vendor web site: www.fei.com/products/dualbeam/helios-nanolab/