JEOL 6500 Field Emission Gun

Description:

Field-emission gun Scanning electron microscope (FEG-SEM) equipped with an energy dispersive spectrometer (EDS).  It operates at 0.5 to 30 kV with an ultimate resolution of 1.5 nm, and a magnification range of 10x to 400,000x.  Available image modes include secondary and backscattered electron images, X-Ray mapping, electron backscatter diffraction and cathodoluminescence.

Applications:

• Examination of fracture surfaces.
• Phase identification from geological samples.
• Examination and quantification of nano-scratch tests.
• Stereo-imaging of surfaces.
• Microstructure of surfactant systems.
• Evaluation of lithographic specimens.
• Measurement of the width of layers of magnetic read devices.
• Characterization of grain boundaries of ceramics.

Specifications:

• High resolution secondary electron imaging; backscatter electron imaging; energy dispersive spectroscopy; electron backscatter diffraction; and cathodoluminescence
• Thermally-assisted field-emission gun
• Accelerating voltage from 0.5 to 30 kV
• Lateral resolution of 1.5 nm
• Magnification ranges from 10 X to 400,000X
• Sample size: 50 x 125 x 125 mm
• Backscattered imaging at TV rates and low voltage using the Centaurus detector
• Chemical analysis of bulk samples with elements as low as sodium available using a Thermo-Noran Vantage system
• Cathodoluminescence analysis with a Gatan (Oxford) MonoCL 2 system
• Crystallographic analysis with an EBSD system from HKL allowing pattern indexing and texture mapping with Channel 5 software

Equipment:

• JEOL 6500 with a variety of sample holders.
• Backscattered imaging at TV rates and low voltage using the Centaurus detector.
• Chemical analysis of bulk samples with elements as low as sodium available using a Thermo-Noran Vantage system.
• Cathodoluminescence analysis with a Gatan (Oxford) MonoCL 2 system.
• Crystallographic analysis with a EBSD system from HKL allowing pattern indexing and texture mapping with Channel 5 software.

Accessories:

• Back scatter detector
• EDS system
• Specimen current detector
• Electron Backscatter patterns
• Cathodoluminescence
• Chamberscope for optical viewing specimen in the microscope.

Capabilities:

• Sample size: 50 x 125 x 125 mm
• Lateral resolution: 1.5 nm
• Lateral range: 50 mm x 50 mm