Chris Kim

Distinguished McKnight University Professor, Louis John Schnell Professor, Department of Electrical and Computer Engineering

Contact

chriskim@umn.edu

612-625-2346

4-161 Kenneth H. Keller Hall
200 Union Street Se
Minneapolis, MN 55455

VLSI Research Group

Chris Kim

Distinguished McKnight University Professor, Louis John Schnell Professor, Department of Electrical and Computer Engineering

Research

VLSI Research Group

My research focuses on designing energy-efficient, robust, and intelligent integrated circuits and systems. Our main expertise is in building chips but we also collaborate extensively with researchers in materials, devices, algorithms, systems, and signal processing. Over the years, we have transferred several key technologies to the semiconductor industry, including the silicon odometer circuit for measuring circuit wear out, radiation monitoring circuits, and SPICE models for magnetic tunnel junctions.

Visit Chris Kim's Experts@Minnesota profile page.

Biography

Education

Ph.D., EE, 2004, Purdue University, West Lafayette, IN, United States
M.S., BME, 2000, Seoul National University, Seoul, Korea
B.S., EE, 1998, Seoul National University, Seoul, Korea

Professional Background

Digital and mixed-signal circuit design, circuit reliability, radiation effects, time-based circuits, spintronic circuits, hardware security, novel computing, machine learning hardware

Teaching

Publications & Awards

Honors and Awards

2019 IEEE Fellow
2018 George W. Taylor Award for Distinguished Research (Collegiate Award)
2016 SRC Technical Excellence Award
2012 Council of Graduate Students Outstanding Faculty Award
2009 NSF CAREER Award
2008 McKnight Land-Grant Professorship Award
2008 3M Non-Tenured Faculty Award
2006-2008 IBM Faculty Partnership Award
2005 IEEE Circuits and Systems Society Outstanding Young Author Award

Selected Publications

M. Kim, M. Liu, L. Everson, G. Park, Y. Jeon, S. Kim, S. Lee, S. Song, and C.H. Kim, “A 3D NAND Flash Ready 8-Bit Convolutional Neural Network Core Demonstrated in a Standard Logic Process”, IEEE International Electron Devices Meeting (IEDM), Dec. 2019

N. Pande, C. Zhou, MH Lin, R. Fung, R. Wong, S. Wen, and C.H. Kim, “Characterizing Electromigration Effects in a 16nm FinFET Process Using a Circuit Based Test Vehicle”, IEEE International Electron Devices Meeting (IEDM), Dec. 2019

L. Everson, S. Sapatnekar, and C.H. Kim, “A 40×40 Four-Neighbor Time-Based In-Memory Computing Graph ASIC Chip Featuring Wavefront Expansion and 2-Dimensional Gradient Control”, International Solid-State Circuits Conference (ISSCC), Feb. 2019

S. Kumar, M. Cho, L. Everson, Q. Tang, P. Meinerzhagen, A. Malavasi, D. Lake, C. Tokunaga, M. Khellah, J. Tschanz, V. De, and C.H. Kim, “Analysis of Neutron-Induced Multi-Bit-Upset (MBU) Clusters in 14nm Tri-Gate Flip-Flop Array”, IEEE Trans. on Nuclear Science (TNS), Apr. 2019

M. Liu and C.H. Kim, “A Powerless and Non-volatile Counterfeit IC Detection Sensor in Standard Logic Processes Based on an Exposed Floating-Gate Array”, IEEE Trans. on Electron Devices (TED), Issue 6, Vol. 66, pp. 2735-2740, June 2019

Google Scholar Page