Characterization Tools
More About Characterization
- Analytical Ultracentrifuge
- Atomic Force Microscope - Keller
- Atomic Force Microscope - PAN
- Confocal Scope
- CV-IV (Capacitance-Voltage and Current Voltage) Measurement System
- Film Stress Measurement (FSM)
- Filmetrics-Film Thickness
- FilmSense-Film Thickness
- Four Point Probe
- Gaertner-Ellipsometer
- Keyence-Scope
- NanoDrop One C UV-Vis Spectrophotometer
- Nanospec
- P7-Surface Profiler
- Rudolph-Ellipsometer
- SEM (Scanning Electron Microscope) Sputterer
- SEM (Scanning Electron Microscope)-JEOL 6610-Keller
- SEM (Scanning Electron Microscope)-JEOL 6700-PAN
- Woolam-Ellipsometer
- Zoom Scope