Nanospec

More About Characterization

• Analytical Ultracentrifuge
• Atomic Force Microscope - Keller
• Atomic Force Microscope - PAN
• Characterization Tools
• Confocal Scope
• CV-IV (Capacitance-Voltage and Current Voltage) Measurement System
• Film Stress Measurement (FSM)
• Filmetrics-Film Thickness
• FilmSense-Film Thickness
• Four Point Probe
• Gaertner-Ellipsometer
• Keyence-Scope
• NanoDrop One C UV-Vis Spectrophotometer
• P7-Surface Profiler
• Rudolph-Ellipsometer
• SEM (Scanning Electron Microscope) Sputterer
• SEM (Scanning Electron Microscope)-JEOL 6610-Keller
• SEM (Scanning Electron Microscope)-JEOL 6700-PAN
• Woolam-Ellipsometer
• Zoom Scope

More About Equipment - N

• Equipment A-Z
• NanoDrop One C UV-Vis Spectrophotometer
• Nanoimprinter
• Nanoparticle Tracking Analyzer

More About PAN - Bay 2

• AV1 Etcher-PAN
• Critical Point (CP) Dryer
• Equipment in PAN
• FilmSense-Film Thickness
• Ion Mill
• Oxford Etcher
• Spin Rinse Dryer
• Wirebonder