Atomic Force Microscope - PAN
Type: Characterization
Description: Uses a sharp tip to scan substrate sample and produce high resolution 3D images. Vertical range of a few Å, up to 4 µm.
Substrate Compatibility: Varying sizes allowed, from pieces, all the way up to 6 inch wafers, and maximum 0.5 inch thick.
Location: PAN-Bay 1
Badger Name: P1 AFM DI5000
Training: Review the SOP prior to requesting training.
