Atomic Force Microscope - Keller
Type: Characterization
Description: Uses a sharp tip to scan substrate sample and produce high resolution 3D images. Vertical range of a few Å, up to 4 µm.
Substrate Compatibility: Varying sizes allowed, from pieces, all the way up to 8 inch wafers, and maximum thickness of 0.5 inch.
Location: Keller-Bay 1
Badger Name: K1 AFM DI3000
Supplemental Material: Operation Note
Training: Review the SOP prior to requesting training.
