Atomic Force Microscope - Keller

Type: Characterization

Description: Uses a sharp tip to scan substrate sample and produce high resolution 3D images. Vertical range of a few Å, up to 4 µm.

Substrate Compatibility: Varying sizes allowed, from pieces, all the way up to 8 inch wafers, and maximum thickness of 0.5 inch.

Location: Keller-Bay 1

Badger Name: K1 AFM DI3000

Supplemental Material: Operation Note

Training: Review the SOP prior to requesting training.