Four Point Probe
Type: Characterization
Description: Measure thin film or doped silicon surface resistance. Compatible with small pieces, up to 4 inch wafers.
Substrate Compatibility: Varying sizes allowed, from pieces, all the way up to 4 inch wafers.
Location: Keller-Bay 1
Badger Name: K1 4 Point Probe Veeco FPP5000
Training: Watch training video and review SOP prior to requesting training.
