CV-IV (Capacitance-Voltage and Current Voltage) Measurement System
Type: Characterization
Description: The mercury probe, when used with the HP4280A capacitance meter and a simple program, provides a quick, non-destructive C-V measurement, but it must be performed on a sample with a minimum radius of 2 cm to prevent mercury leakage. The HP4145A Parameter Analyzer and Signatone probe station are set up to carry out the computer controlled measurement of the I-V characteristics of a BJT, FET, or diode.
Substrate Compatibility: Varying sizes allowed, from pieces as small as 2cm, all the way up to 8 inch wafers.
Location: Keller-Area 2
Badger Name: KA3 CVIV testing
Training: Review SOP prior to requesting training.